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MacTempasX Version 2 represent a major upgrade of
MacTempas. The program has been expanded to include a
huge number of new features. In addition to the basic
image/diffraction HRTEM capabilities, STEM and CBED calculations
have been included. The program now includes both basic
and advanced image processing capabilities as well as
quantitative image comparison and structure refinement.
Short
Highlight of MacTempasX Features |
- Full multislice calculation of High Resolution TEM Images and Dynamical
Diffraction Patterns
- Full multislice calculation of High Resolution STEM images
- "Live" control of calculated HRTEM image and exit wave as a function
of simulation parameters
- Calculation of kinematical SAD patterns and Kikuchi patterns
- Calculation of kinematical CBED patterns
- Bloch wave calculation of CBED patterns
- Ring patterns
- Automatic calculation of HRTEM tilt series
- Full quantitative comparison of simulated and experimental images
- Structure and microscope parameter refinement based on quantitative
image match
- Reciprocal space tables, plane spacing and angle calculator
- Full image manipulation
- All basic image processing features
- Advanced image processing features, real space, reciprocal space
filters, masks, noise filters, etc.
- Peak finding, peak fitting and lattice fitting
- Template matching for pattern search
- Real and reciprocal space displacement and strain analysis
- Crystallographic image processing
- diffraction pattern quantification
- Motif extraction and averaging with noise estimation
- Full reverse polish notation image calculator
- Image alignment
- Focus determination
- Supports reading Gatan Digital Micrograph images (image data and
calibration)
- Optional scripting language module
- Optional exit wave and object reconstruction package
- Plus many more features...
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| Example screen shots
from MacTempasX |
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